Venez vous perfectionner sur les techniques de caractérisation des interfaces. Le Labex Interactifs et l'EUR InTREE vous proposent 4 enseignements par des spécialistes. Inscription gratuite mais obligatoire.

Fluid measurements close to interfaces (6 h.) – Laurent David et Patrick Braud

28th March, 9 a.m.-12 p.m. and 2 p.m.-5 p.m.

The course will present optical methods like Laser Doppler Velocimetry and Particle image Velocimetry to measur the velocity close to the interfaces or to characterize the interface.

Contenu pédagogique / teaching content :

  • 9h-12h lecture: presentation of the different methods (room to be defined)
  • 14h-17h practical application by small groups
  • LDV: principle and application
  • PIV: principle and application
  • Optical method to define the position of the interface
  • Practical application of LDV and PIV

Number of places : 2x 10 persons for the practical application and unlimited for the general lecture


AFM : Atomic Force Microscopy (6h) – Christophe Tromas

Monday March 28, 9 a.m.-12 p.m. and 2 p.m.-5 p.m.

This seminary aims at presenting the Scanning Probe Microscopy (SPM) techniques, and more specifically the Atomic Force Microscopy (AFM). AFM is a surface microscopy technique which consists in scanning a surface with a nanometer size tip while monitoring the interactions between the tip and the surface. The signal is then processed to reconstruct a 3D image of the surface topography, at scales ranging from 100 µm down to atomic resolution.

Contenu pédagogique / teaching content :

  • Introduction et historique / Introduction and history of SPM
  • Microscopie à effet tunnel / Scanning Tunneling Microscopy
  • Le mode contact / Microscopie Atomic Force microscopy in contact mode
  • Le mode dynamique / Atomic Force Microscopy in dynamic mode
  • Pointes et scanner / AFM probes and scanners
  • Image et analyse / AFM image processing and analysis
  • Au-delà de l’imagerie topographie / AFM – beyond topographic imaging
  • Applications/ Applications of AFM (academic lab, industry)
  • Le microscope / Practicals: Atomic resolution in STM, AFM settings


XPS : X-ray photoelectron spectrometry (6h) – Tekko Napporn

Thuesday March 29, 8.15 – 12.30 am / 13.30-18.00 pm

Initiation au principe, aux bases théoriques et expérimentales de l’XPS / Initiating into the principle, the theoretical and experimental basics of XPS

Contenu pédagogique / teaching content :

  • Introduction to the XPS technique / Introduction à la technique XPS
  • Les bases physiques et principe / the Physical basics and principle
  • L’équipement / XPS instrumentation
  • l’analyse de surface par XPS / Surface analysis by XPS
  • les spectres / XPS spectra
  • quelques applications / applications
  • visite de l’équipement / visit at the XPS laboratory


WFTMT : Wall and Fluid Temperature Measurement Techniques (6h.) – Gildas Lazilel

29th March, 9 a.m.-12 p.m. and 2 p.m.-5 p.m.

This seminary consists to study different existing or in development techniques to precisely measure temperature in fluids (laminar or turbulent flow) or in solid (wall or inside). Intrusive (thermocouples, cold wire, …) and non-intrusive techniques will be presented (Pyrometry, Infrared camera, Laser Induced Fluorescence or Phosphorescence). Physical concepts associated to each metrology will be presented / Ce séminaire consiste à étudier différentes techniques existantes ou en développement pour mesurer précisément la température dans les fluides (écoulement laminaire ou turbulent) ou dans le solide (mur ou intérieur). Des techniques intrusives (thermocouples, fil froid, …) et non intrusives seront présentées (Pyrométrie, Caméra Infrarouge, Laser Induced Fluorescence ou Phosphorescence). Les concepts physiques associés à chaque métrologie seront présentés.

Contenu pédagogique / teaching content :

  • Introduction au transfert de chaleur : conduction, convection et rayonnement thermique / Introduction to heat transfer : Conductive, convective and Radiative heat.
  • Métrologies intrusives : les capteurs : thermocouples, les thermistances, … / Intrusive temperature metrology : thermocouples, thermistance, …
  • Métrologies non intrusives : le rayonnement de luminescence et le rayonnement thermique / Non-intrusive temperature metrology : luminescence and thermal radiation.
  • La pyrométrie, les caméras IR, la Fluorescence Induite par Plan Laser et la Phosphorescence induite par plan Laser / Pyrometry, IR cameras, Plane Laser Induced Fluorescence and Plane Laser Induced Phosphorescence.
  • Présentation de quelques résultats de mesure / Presentation of some measurement results.
  • Visite d’un banc d’essai / Visit to a test bench.



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